This facility offers macro- and micro-scale performance measurement and imaging combined with statistical assessment, correlating device performance metrics with high-resolution microstructural analytics. This addresses the broad efficiency distributions typical in cell processing—driven by spatial/temporal process inhomogeneities and ageing effects—alongside the need for sophisticated, resource-intensive nanodiagnostic root-cause analysis (see CSP-Nano).

Available techniques include (µ-)electroluminescence, photoluminescence, lock-in thermography, hyperspectral imaging, (µ-)light beam induced current, and (rapid) external quantum efficiency measurement, run either on the “MK4” lab-to-fab platform for large sample batches (>>10) or via the fully automated “LOANA” cell analysis system, among other setups.

Access is on-site only, typically for a four-week stay, with instrument access as needed and possible direct collaboration with an experienced operator for hands-on technique training. Sample sizes range from small devices (1×1 cm²) to full industrial cells (M10, G12) and minimodules, with throughput from single cells to several thousand samples depending on setup. Following measurement, users receive support in analyzing and interpreting data, available raw or pre-processed, with statistical batch-evaluation software and AI-based imaging feature detection available; NOMAD integration is planned.