Reliability Evaluation Through Analytics and Data for Emerging Technology in Photovoltaics

D17 – Reflectometer

Advanced Characterization

  • Neutron reflectometry with horizontal scattering geometry to measure the structure of thin films
  • Fast kinetic measurements, magnetic studies, and off-specular scattering analysis—critical for characterizing thin-film interfaces and surface phenomena in PV devices
  • Initial reflectometry experiments on PV cells gave unique insight into the distributions of light atoms like oxygen and hydrogen across interfaces between silicon and conducting metal oxides

Recent upgrades include: a new focusing guide increasing sample flux by 2.5x, polarization optics for time-of-flight polarized measurements, and a high-performance detector with improved uniformity and stability. These support fast kinetic measurements, magnetic studies, and off-specular scattering analysis for thin-film interfaces and surface phenomena in PV devices.

PV Applications

Within the CACTUS project (GA: 101132182), D17 reflectometry experiments on PV cells revealed the distribution of oxygen and hydrogen across silicon–ITO interfaces. Neutron imaging (NeXT) for PV cells and neutron-based UV-aging studies remain unexplored. The Computing for Science group provides software for neutron data analysis, alongside continuously upgraded tools for data collection, treatment, and management to improve beamtime efficiency.