Available Facilities
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Focus: performance monitoring of photovoltaic technologies, with particular emphasis on thin-film perovskite devices
- Electrical Measurement Capabilities
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- 26 measurement channels currently operational
- Configurable under three modes:
- Maximum Power Point Tracking (MPPT)
- Fixed resistance
- Open-circuit conditions
- Current-voltage (IV) measurements follow perovskite-specific protocols
- Each IV point is synchronized with corresponding irradiance level for precise data treatment and analysis
- Operando dark IV measurements available upon request
- Planned expansion to 32 parallel channels by October 2025
- Supports monitoring of perovskite modules mounted on two-axis solar trackers
- Environmental Monitoring
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- Data collected every 1 minute, including:
- Weather conditions: temperature, humidity, wind speed, wind direction
- Broadband and spectral irradiance
- UV index
- Solar spectrum
- Data forms part of the Baseline Surface Radiation Network (BSRN), ensuring high accuracy and traceability
- Includes Radflux measurements for thermal performance analysis
- Data collected every 1 minute, including:
- Data Management
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- All raw data automatically stored and processed
- Custom-built system enabling real-time visualization and monitoring
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AI-Driven Reliability & Degradation Analysis
Combines reliability testing with AI-driven modelling to predict degradation and improve energy-yield forecasting for next-gen PV
- Covers: performance/degradation analysis, AI-based characterization, digital twins, real-time data analysis, multi-technique imaging, IV diagnostics, energy yield, failure detection, and explainable forecasting
- Facility Capabilities
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- Multi-technique characterization: imaging (KP, luminescence), IV diagnostics, energy yield assessment
- AI models couple characterization data with predictive analysis to build a digital twin for real-time monitoring and diagnostics
- Supports failure detection and degradation forecasting, with focus on explainability and traceability
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Uses reference-grade instrumentation to support R&D across three core areas: characterization, prototyping, and accelerated aging
- Characterization
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- Covers optical, morphological, and optoelectronic measurements
- Includes luminescence techniques:
- Electroluminescence (EL)
- Photoluminescence (PL)
- Calibrated electrical and spectral tests available for:
- Single-junction devices
- Tandem devices
- Prototyping
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- Precision scribing
- Stack assembly
- Vacuum lamination, up to 1050 × 560 mm
- Accelerated Ageing
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- Multiple climatic chambers available
- Multiple continuous light soakers available
- Enables implementation of the full ISOS protocol, including intrinsic protocols
- In-situ monitoring incorporated when needed



