Available Facilities

• ESRF-EBS Synchrotron X-ray Characterization for Photovoltaics

  Advanced Characterization

  

  ID01 – nano/micro diffraction imaging

  Imaging and strain studies using coherent x-ray diffraction methods and/or nanodiffraction(beam size min: ~ 35nm; strain sensitivity of 10⁻⁵ and lattice tilt sensitivity of 10⁻³)

  BM05 – X-ray Bragg diffraction imaging (topography)

  Characterisation of defects / distortions in crystals via “white beam topography”, monochromatic Bragg diffraction imaging, and X-ray beam induced current (XBIC)

  ID10 – coherent and surface diffraction

  • Liquid and solid interfaces
  • Grazing incidence studies
  • X-ray reflectivity
  • Length scales from 1 nm to100s of nm

  ID31 – high energy diffraction and scattering

  • In situ and operando high energy scattering –transmission and reflection geometries
  • High Throughput powder diffraction