Reliability Evaluation Through Analytics and Data for Emerging Technology in Photovoltaics

ESRF-EBS Synchrotron X-ray Characterization for Photovoltaics

Advanced Characterization

ID01 – nano/micro diffraction imaging
Imaging and strain studies using coherent x-ray diffraction methods and/or nanodiffraction(beam size min: ~ 35nm; strain sensitivity of 10⁻⁵ and lattice tilt sensitivity of 10⁻³)
BM05 – X-ray Bragg diffraction imaging (topography)
Characterisation of defects / distortions in crystals via “white beam topography”, monochromatic Bragg diffraction imaging, and X-ray beam induced current (XBIC)
ID10 – coherent and surface diffraction
  • Liquid and solid interfaces
  • Grazing incidence studies
  • X-ray reflectivity
  • Length scales from 1 nm to100s of nm
ID31 – high energy diffraction and scattering
  • In situ and operando high energy scattering –transmission and reflection geometries
  • High Throughput powder diffraction

Key beamlines available: BM05 (topography), ID01 (nano-diffraction/scattering), ID10 (coherent diffraction/scattering), and ID31 (high-energy diffraction/scattering)—with other beamlines accessible given a suitable scientific case and capacity. Most techniques support in-situ/operando measurements, allowing observation under illumination, thermal cycling, or environmental stress, linking microscopic mechanisms to device-level behavior. On-site access is standard for visiting researchers, with mail-in remote access available for shorter experiments.

Representative research applications span: strain-performance relationships in silicon solar cells (BM05/ID01); polymer orientation and thermal stability in organic solar cells (ID10); zinc uptake in sustainable CZTS synthesis (ID31); carbon-induced crystal defects in silicon growth (BM05); and microstrain mapping and microdiffraction imaging of thin films and organic devices (ID01).Research examples span several beamlines: microdiffraction imaging for organic electronic devices and microstrain mapping on CuInSe2 films (ID01); crystal distortions from carbon-contaminated silicon growth and strain-stress relationships in Czochralski/mono-like silicon cells linked to back-contact performance (BM05/ID01); zinc uptake challenges in sustainable CZTS synthesis (ID31); and both face-on polymer orientation for high efficiency and thermal stability improvements via fullerene-based acceptors in polymer solar cells (ID10).

Operando and in-situ capabilities across most techniques allow observation of materials under illumination, thermal cycling, or environmental stress—directly connecting microscopic mechanisms to device-level behavior. Additional beamlines beyond the core four may be accessed given a strong scientific case and available capacity.

This project grants access to essential PV characterization beamlines: high-energy diffraction/scattering (ID31), coherent diffraction/scattering (ID10), nano-diffraction/scattering (ID01), and topography (BM05). For emerging materials like nanostructured absorbers, thin-film semiconductors, and perovskites, ESRF’s diffraction and coherence-based methods reveal crystal structure, defect behavior, and phase stability under realistic operating conditions.

Synchrotron X-ray methods deliver structural, chemical, and electronic insight at exceptional spatial and temporal resolution—essential for enhancing PV durability and efficiency. The ESRF-EBS and its advanced X-ray beamline suite provide unmatched multi-scale, multi-modal characterization capabilities for photovoltaic materials and devices.