Available Facilities

• CSP-Nano

  Advanced Characterization

  

  • Sample Preparation & Nano structural Analytics
  • UHV operando-PES (coupled XPS/UPS/REELS/Raman) Operando-ToF-SIMS (electrical bias)
  • SEM-EBIC
  • (S)TEM-EDX/EELS

• CSP-Indoor

  Indoor Testing

  

  • Lab-based-performance measurement sand imaging (EL,PL,LIT,HIS,LBIC,EQE)
  • Processing of large sample batches inlab-to-fab platform “MK4”
  • 1x1cm²up to M10/G12

• CSP-Outdoor

  Outdoor Testing

  

  • Free-field installation with “BOM-Tester”
  • Rack with up to 16 industrial size 1-cell mini-modules Adjustable angle
  • Periodical IV tracing
  • Tracks irradiance and temperature